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Senior IC Physical Failure Analysis Engineer

NVIDIA

NVIDIA

Posted on Apr 7, 2026

NVIDIA Networking IC Product Engineering team is looking for a highly skilled IC physical failure analysis (PFA) engineer to join our growing team and support PFA activities for yield improvement, product bring-up, customer returns, and product qualification. As a PFA engineer, you will own the physical failure analysis (PFA) part, develop work procedures/techniques/recipes, and perform PFA of IC’s using in-house equipment and in external labs.

What You Will Be Doing:

Opera

  • te dual-beam PFIB and develop workflows for the following applications:

  • Site-specific cross-sectioning

  • TEM sample preparation

  • IC delayer

  • Large scale cross-sections

  • Unique sample preparation for different probing and imaging techniques

Use

  • SEM based nanoprobing techniques for fault isolation and device/cell characterization based on FA plan provided by the EFA engineers

  • EBAC/EBIC/EBRICH for fault isolation

  • Device and cell level measurements

  • Own and lead nanoprobing activities, including method development and execution. Continuously drive improvements, stay up-to date, and collaborate with vendors on new techniques.

  • Sample preparation for optical fault isolation, probing and more: use P-lapping and CNC for Si thinning and IC delayering

What We Need to See:

  • BSc in Materials/chemical engineering, physics, chemistry, or related fields

  • 5+ years of relevant industry experience in IC package or die level Failure Analysis.

  • Ability to work and collaborate as part of a team and independently

  • Self-motivated with the ability to learn alone and review the literature to find solutions to our challenges.

  • Insist on high standards for high-quality samples

  • Good documentation and communication skills

Ways To Stand Out From The Crowd:

  • Good understanding of VLSI circuit design, and/or device physics, and/or IC process engineering

  • Experience with various IC delayering methods

  • Background with dual beam FIB for cross-sections and preparing lamella for TEM

  • Experience with SEM based nano-probing